Content-type: text/application/x-research-info-systems

TY  - JOUR
AU  - Chan, A
AU  - McNaught, K R
TI  - Using Bayesian networks to improve fault diagnosis during manufacturing tests of mobile telephone infrastructure
JA  - J Oper Res Soc
PY  - 2007/02/28/online
VL  - 59
IS  - 4
SP  - 423
EP  - 430
PB  - Palgrave Macmillan Ltd
SN  - 0160-5682
UR  - http://dx.doi.org/10.1057/palgrave.jors.2602388
ER  -