Content-type: text/application/x-research-info-systems

TY  - JOUR
AU  - Pearn, W L
AU  - Chung, S H
AU  - Yang, M H
AU  - Shiao, K P
TI  - Solution strategies for multi-stage wafer probing scheduling problem with reentry
JA  - J Oper Res Soc
PY  - 2007/01/03/online
VL  - 59
IS  - 5
SP  - 637
EP  - 651
PB  - Palgrave Macmillan Ltd
SN  - 0160-5682
UR  - http://dx.doi.org/10.1057/palgrave.jors.2602354
ER  -