Content-type: text/application/x-research-info-systems

TY  - JOUR
AU  - Wang, W Y
AU  - Sheu, S H
AU  - Chen, Y C
AU  - Horng, D J
TI  - On a more general formulation of off-line inspection with inspection errors
JA  - J Oper Res Soc
PY  - 0000///print
VL  - 59
IS  - 6
SP  - 865
EP  - 867
PB  - Palgrave Macmillan Ltd
SN  - 0160-5682
UR  - http://dx.doi.org/10.1057/palgrave.jors.2602546
ER  -