Content-type: text/application/x-research-info-systems

TY  - JOUR
AU  - Chun, Young H
TI  - Economic optimization of off-line inspection procedures with inspection errors
JA  - J Oper Res Soc
PY  - 0000///print
VL  - 59
IS  - 6
SP  - 863
EP  - 865
PB  - Palgrave Macmillan Ltd
SN  - 0160-5682
UR  - http://dx.doi.org/10.1057/palgrave.jors.2602547
ER  -